@article{ ISI:000293665600044,
Author = {Liu, Xiao Hua and Zheng, He and Zhong, Li and Huan, Shan and Karki, Khim
   and Zhang, Li Qiang and Liu, Yang and Kushima, Akihiro and Liang, Wen
   Tao and Wang, Jiang Wei and Cho, Jeong-Hyun and Epstein, Eric and Dayeh,
   Shadi A. and Picraux, S. Tom and Zhu, Ting and Li, Ju and Sullivan, John
   P. and Cumings, John and Wang, Chunsheng and Mao, Scott X. and Ye, Zhi
   Zhen and Zhang, Sulin and Huang, Jian Yu},
Title = {{Anisotropic Swelling and Fracture of Silicon Nanowires during Lithiation}},
Journal = {{NANO LETTERS}},
Year = {{2011}},
Volume = {{11}},
Number = {{8}},
Pages = {{3312-3318}},
Month = {{AUG}},
Abstract = {{We report direct observation of an unexpected anisotropic swelling of Si
   nanowires during lithiation against either a solid electrolyte with a
   lithium counter-electrode or a liquid electrolyte with a LiCoO(2)
   counter-electrode. Such anisotropic expansion is attributed to the
   interfacial processes of accommodating large volumetric strains at the
   lithiation reaction front that depend sensitively on the
   crystallographic orientation. This anisotropic swelling results in
   lithiated Si nanowires with a remarkable dumbbell-shaped cross section,
   which develops due to plastic flow and an ensuing necking instability
   that is induced by the tensile hoop stress buildup in the lithiated
   shell. The plasticity-driven morphological instabilities often lead to
   fracture in lithiated nanowires, now captured in video. These results
   provide important insight into the battery degradation mechanisms.}},
Publisher = {{AMER CHEMICAL SOC}},
Address = {{1155 16TH ST, NW, WASHINGTON, DC 20036 USA}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Zhu, T (Reprint Author), Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA.
   Huan, Shan; Zhu, Ting, Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA.
   Liu, Xiao Hua; Liu, Yang; Sullivan, John P., Sandia Natl Labs, Ctr Integrated Nanotechnol, Albuquerque, NM 87185 USA.
   Zheng, He; Zhong, Li; Zhang, Li Qiang; Wang, Jiang Wei; Mao, Scott X., Univ Pittsburgh, Dept Mech Engn \& Mat Sci, Pittsburgh, PA 15261 USA.
   Karki, Khim; Epstein, Eric; Cumings, John, Univ Maryland, Dept Mat Sci \& Engn, College Pk, MD 20742 USA.
   Kushima, Akihiro; Li, Ju, Univ Penn, Dept Mat Sci \& Engn, Philadelphia, PA 19104 USA.
   Liang, Wen Tao, Penn State Univ, Dept Engn Sci \& Mech, University Pk, PA 16802 USA.
   Cho, Jeong-Hyun; Dayeh, Shadi A.; Picraux, S. Tom, Los Alamos Natl Lab, Ctr Integrated Nanotechnol, Los Alamos, NM 87545 USA.
   Li, Ju, Xi An Jiao Tong Univ, State Key Lab Mech Behav Mat \& Frontier, Inst Sci \& Technol, Xian 710049, Peoples R China.
   Wang, Chunsheng, Univ Maryland, Dept Chem \& Biomol Engn, College Pk, MD 20742 USA.
   Zhang, Li Qiang; Ye, Zhi Zhen, Zhejiang Univ, State Key Lab Silicon Mat, Dept Mat Sci \& Engn, Hangzhou 310027, Peoples R China.
   Zheng, He, Wuhan Univ, Dept Phys, Ctr Elect Microscopy, Wuhan 430072, Peoples R China.
   Zheng, He, Wuhan Univ, Key Lab Acoust \& Photon Mat \& Devices, Wuhan 430072, Peoples R China.}},
DOI = {{10.1021/nl201684d}},
ISSN = {{1530-6984}},
Keywords = {{Silicon nanowire; lithium ion battery; anisotropic swelling; volume
   expansion; fracture; in situ TEM}},
Keywords-Plus = {{LI-ION BATTERIES; SOLID-STATE AMORPHIZATION; ELECTROCHEMICAL LITHIATION;
   CRYSTALLINE SILICON; STRUCTURAL-CHANGES; LITHIUM INSERTION;
   HIGH-CAPACITY; THIN-FILMS; ELECTRODES; ANODES}},
Research-Areas = {{Chemistry; Science \& Technology - Other Topics; Materials Science;
   Physics}},
Web-of-Science-Categories  = {{Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience \&
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter}},
Author-Email = {{ting.zhu@me.gatech.edu
   liju@seas.upenn.edu
   jhuang@sandia.gov}},
ResearcherID-Numbers = {{Wang, Jiangwei/F-8249-2011
   Kushima, Akihiro/H-2347-2011
   Wang, Chunsheng/H-5767-2011
   Cumings, John/A-3595-2012
   Karki, Khim/B-2271-2012
   Liu, Yang/C-9576-2012
   Liu, Xiaohua/A-8752-2011
   Huang, Jianyu/C-5183-2008
   Zheng, He/E-2964-2012
   Zhu, Ting/A-2206-2009
   Li, Ju/A-2993-2008
   Dayeh, Shadi/H-5621-2012
   Zhang, Sulin /E-6457-2010}},
ORCID-Numbers = {{Wang, Jiangwei/0000-0003-1191-0782
   Wang, Chunsheng/0000-0002-8626-6381
   Karki, Khim/0000-0002-0999-3964
   Liu, Xiaohua/0000-0002-7300-7145
   Zheng, He/0000-0002-6476-8524
   Li, Ju/0000-0002-7841-8058
   }},
Funding-Acknowledgement = {{U.S. Department of Energy, Office of Science, Office of Basic Energy
   Sciences {[}DESC0001160]; U.S. Department of Energy's National Nuclear
   Security Administration {[}DE-AC04-94AL85000]; NSF {[}CMMI-0758554,
   CMMI-0825435, DMR-1008104]; AFOSR {[}FA9550-08-1-0325]}},
Funding-Text = {{Portions of this work were supported by a Laboratory Directed Research
   and Development (LDRD) project at Sandia National Laboratories (SNL) and
   partly by Nanostructures for Electrical Energy Storage (NEES), an Energy
   Frontier Research Center (EFRC) funded by the U.S. Department of Energy,
   Office of Science, Office of Basic Energy Sciences under Award Number
   DESC0001160. The LDRD supported the development and fabrication of
   platforms. The NEES center supported the development of TEM techniques.
   CINT supported the TEM capability; in addition, this work represents the
   efforts of several CINT users, primarily those with affiliation external
   to Sandia National Laboratories. In addition, this work was performed,
   in part, at the Sandia-Los Alamos Center for Integrated Nanotechnologies
   (CINT), a U.S. Department of Energy, Office of Basic Energy Sciences
   user facility. Sandia National Laboratories is a multiprogram laboratory
   operated by Sandia Corporation, a wholly owned subsidiary of Lockheed
   Martin Company, for the U.S. Department of Energy's National Nuclear
   Security Administration under Contract DE-AC04-94AL85000. T.Z.
   acknowledges the support by NSF Grants CMMI-0758554 and CMMI-0825435.
   A.K. and J.L. acknowledge support by NSF DMR-1008104 and AFOSR
   FA9550-08-1-0325.}},
Number-of-Cited-References = {{48}},
Times-Cited = {{123}},
Journal-ISO = {{Nano Lett.}},
Doc-Delivery-Number = {{804PJ}},
Unique-ID = {{ISI:000293665600044}},
}